ATIS T1.TR.48-1996

Test Patterns for DS0 and Synchronous Digital Data Circuits

The Alliance for Telecommunications Industry Solutions , 06/01/1996

Publisher: ATIS

File Format: PDF

$30.00$60.00

This report documents the various test patterns used to qualify and troubleshoot both DS0 and Synchronous Digital Data Circuits.

Published: 06/01/1996

File Size: 1 file , 34 KB

Language: English

Note: This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus

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