Describes the data exchange format which can be used to make available test chip (PTC) measured data to companies which have no access to the PTC of the desired technology or the required measurement equipment.Cross References:CENELEC R117-001CENELEC R117-004CENELEC ENV 50219CENELEC R117-005CENELEC R117-006CENELEC R117-10CENELEC R217-017
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