BS PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

BSI Group , 01/29/2018

Publisher: BS

File Format: PDF

$95.00$190.00

Description

BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.Cross References:IEEE 1149.1:2013

Published: 01/29/2018

Pages: 20

File Size: 1 file , 1.4 MB

ISBN: 9780580988516

Language: English

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