This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs)using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conductingSWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTsin a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.Cross References:ISO/TS 80004-4ISO/TS 80004-6
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