IEC 60512-25-3 Ed. 1.0 b:2001

Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation

International Electrotechnical Commission , 07/26/2001

Publisher: IEC

File Format: PDF

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Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.

Published: 07/26/2001

Pages: 23

File Size: 1 file , 380 KB

Language: English, French

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