IEC 60512-25-6 Ed. 1.0 b:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

International Electrotechnical Commission , 05/26/2004

Publisher: IEC

File Format: PDF

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Describes methods for measuring an eye pattern response and jitter in the time domain.

Published: 05/26/2004

Pages: 35

File Size: 1 file , 900 KB

Language: English, French

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