IEC 60748-11-1 Ed. 1.0 b:1992

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

International Electrotechnical Commission , 04/01/1992

Publisher: IEC

File Format: PDF

$139.00$278.00

Description

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Published: 04/01/1992

Pages: 71

File Size: 1 file , 2.5 MB

Language: English, French

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