IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 03/28/2019

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Published: 03/28/2019

Pages: 17

File Size: 1 file , 1000 KB

Language: English, French

Note: This product is unavailable in Ukraine, Russia, Belarus

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