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IEC 60749-43 Ed. 1.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

International Electrotechnical Commission , 06/15/2017

Publisher: IEC

File Format: PDF

$129.00$259.00


IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Published: 06/15/2017

Pages: 74

File Size: 1 file , 1.1 MB

Language: English, French

Note: This product is unavailable in Ukraine, Russia, Belarus

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