IEC 62047-10:2011 specifies micro-pillar compression test method to measure compressive properties of MEMS materials with high accuracy, repeatability, and moderate effort of specimen fabrication. The uniaxial compressive stress-strain relationship of a specimen is measured, and the compressive modulus of elasticity and yield strength can be obtained. This standard is applicable to metallic, ceramic, and polymeric materials.
More Standards PDF
IEC 61158-5-28 Ed. 1.0 b:2023
$208.00 $417.00
IEEE 400.3-2022
$42.00 $84.00
IEC 63376 Ed. 1.0 b:2023
$208.00 $417.00
IEC 61196-8 Ed. 2.0 en:2023
$72.00 $145.00





