IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.
More Standards PDF
IEC 60807-7 Ed. 1.0 b:1991
$183.00 $367.00
IEC 61078 Ed. 1.0 b:1991
$45.00 $91.00
IEC 61102 Ed. 1.0 b:1991
$78.00 $157.00
IEC 61069-1 Ed. 1.0 b:1991
$78.00 $157.00