IEC 62137-1-3 Ed. 1.0 b:2008

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test

International Electrotechnical Commission , 11/27/2008

Publisher: IEC

File Format: PDF

$95.00$190.00


The test method described in IEC 62137-1-3:2008 applies to solder joints between terminals of surface mounting devices (SMDs) and land patterns on printed wiring boards (PWBs). This test is intended to evaluate the strength of the solder joints of larger sized multi-terminal components and other components in devices (e.g. handheld mobile devices) in the event that the device is dropped. The properties of the solder joints (e.g. solder alloy, substrate, mounted device or design, etc.) are evaluated to assist in improving the strength of the solder joints.

More Standards PDF

IEC 62026-2 Ed. 1.0 b:2000

IEC 62026-2 Ed. 1.0 b:2000

$116.00 $232.00

IEEE C57.12.00-2000

IEEE C57.12.00-2000

$70.00 $141.00

IEEE 1478-2001

IEEE 1478-2001

$55.00 $110.00

IEC 62026-5 Ed. 1.0 b:2000