IEC 62373 Ed. 1.0 b:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

International Electrotechnical Commission , 07/18/2006

Publisher: IEC

File Format: PDF

$47.00$95.00

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Published: 07/18/2006

Pages: 27

File Size: 1 file , 530 KB

Language: English, French

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