IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

International Electrotechnical Commission , 03/29/2007

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Published: 03/29/2007

Pages: 43

File Size: 1 file , 720 KB

Language: English, French

Note: This product is unavailable in Ukraine, Russia, Belarus

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