IEC 62415 Ed. 1.0 b:2010

Semiconductor devices - Constant current electromigration test

International Electrotechnical Commission , 05/19/2010

Publisher: IEC

File Format: PDF

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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Published: 05/19/2010

Pages: 22

File Size: 1 file , 910 KB

Language: English, French

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