IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
More Standards PDF
IEC 62821-2 Ed. 1.0 b:2015
$25.00 $51.00
IEC 60702-2 Ed. 2.1 b:2015
$41.00 $82.00
IEC 60393-6 Ed. 2.0 b:2015
$117.00 $234.00
IEC 63004 Ed. 1.0 en:2015
$240.00 $481.00





