Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
More Standards PDF
IEC 60704-2-5 Ed. 2.0 b:2005
$25.00 $51.00
IEC 60601-2-51 Ed. 1.0 b:2005
$125.00 $250.00
IEC 60947-4-1 Amd.2 Ed. 2.0 b:2005
$71.00 $143.00
IEC 60076-7 Ed. 1.0 b:2005
$158.00 $317.00