This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
More Standards PDF
IEC 61400-50 Ed. 1.0 b:2022
$47.00 $95.00
IEC 61215-1-2 Ed. 2.1 b:2022
$50.00 $101.00
IEC 62271-204 Ed. 2.0 b:2022
$183.00 $367.00
IEC 60601-2-45 Amd.2 Ed. 3.0 b:2022
$25.00 $51.00