• JIS Z 4334:2005

JIS Z 4334:2005

Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)

Japanese Industrial Standard / Japanese Standards Association , 01/01/2005

Publisher: JIS

File Format: PDF

$29.00$58.00


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