JIS Z 4334:2005

Name: JIS Z 4334:2005|2005 edition pdf
Price: 29 USD
Availability: InStock

Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)

Japanese Industrial Standard / Japanese Standards Association , 01/01/2005

Publisher: JIS

File Format: PDF

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Published: 01/01/2005

Language: English

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