IEC 60068-2-82 Ed. 1.0 b:2007

Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components

International Electrotechnical Commission , 05/23/2007

Publisher: IEC

File Format: PDF

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IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.

IEC 60068-2-82 Ed. 1.0 b:2007 History

IEC 60068-2-82 Ed. 2.0 b:2019
IEC 60068-2-82 Ed. 1.0 b:2007
IEC 60068-2-82 Ed. 1.0 en:2007

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