IEC 60749-5 Ed. 3.0 b:2023

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

International Electrotechnical Commission , 12/01/2023

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

Published: 12/01/2023

Pages: 22

File Size: 1 file , 720 KB

ISBN: 9782832280331

Language: English, French

Note: This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-5 Ed. 3.0 b:2023 History

IEC 60749-5 Ed. 3.0 b:2023

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