Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
IEC 60749-7 Ed. 1.0 b:2002 History
IEC 60749-7 Ed. 2.0 b:2011
$25.00 $51.00
IEC 60749-7 Ed. 1.0 b:2002
$21.00 $42.00
More Standards PDF
IEC 61754-3 Ed. 1.0 en:1996
$21.00 $43.00
IEEE C37.112-1996
$66.00 $133.00
IEC 60050-806 Ed. 2.0 b:1996
$208.00 $417.00
IEC 60034-18-21 Amd.2 Ed. 1.0 b:1996
$22.00 $44.00