IEC 60749-7 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

International Electrotechnical Commission , 04/09/2002

Publisher: IEC

File Format: PDF

$21.00$42.00

Description

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Published: 04/09/2002

Pages: 15

File Size: 1 file , 430 KB

Language: English, French

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