IEC 61164 Ed. 2.0 en:2004

Reliability growth - Statistical test and estimation methods

International Electrotechnical Commission , 03/24/2004

Publisher: IEC

File Format: PDF

$121.00$243.00


Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

IEC 61164 Ed. 2.0 en:2004 History

IEC 61164 Ed. 2.0 b:2004

IEC 61164 Ed. 2.0 b:2004

$183.00 $367.00

IEC 61164 Ed. 2.0 en:2004

IEC 61164 Ed. 2.0 en:2004

$121.00 $243.00

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