Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
IEC 61967-4 Ed. 1.1 b:2006 History
IEC 61967-4 Ed. 2.0 b:2021
$164.00 $329.00
IEC 61967-4 Ed. 1.1 b:2006
$161.00 $323.00
IEC 61967-4 Ed. 1.0 b:2002
$50.00 $101.00
More Standards PDF
IEEE 11073-10417-2011
$87.00 $175.00
IEC 61757-1 Ed. 2.0 b:2012
$117.00 $235.00
IEEE 802.22.2-2012
$30.00 $61.00
IEC 61988-2-5 Ed. 1.0 b:2012
$25.00 $51.00












