IEEE C37.233-2009

This guide covers suggested test requirements for power system protection scheme testing, system application tests, the scope and level of tests based on the application, and benefits of the overall protective schemes testing. This guide encompasses overall system testing procedures (generators, line, line reactors, transformer, capacitors, special protection schemes, end-to-end testing, distributed application within substation, etc.) and data collection requirements, as well as the test procedure definitions. This guide describes the methods, extent, and types of system tests for protection applications at various voltage levels. Control functions inherent to the protective systems are included. Importance of line testing, indirect trip applications, open/closed-loop tests, and dynamic/nonlinear tests are also covered. This guide is intended for power system protection professionals. It includes a reference list of type tests for protective devices as well as overall protection scheme performance tests for various types of protection schemes. The guide describes the methods, extent, and types of protection scheme tests. Interlocking and control functions inherent to the protective schemes are included. New IEEE Standard - Inactive-Reserved. This guide covers suggested test requirements for power system protection scheme testing, system application tests, the scope and level of tests based on the application, and benefits of the overall protective schemes testing. This guide encompasses overall system testing procedures (generators, line, line reactors, transformer, capacitors, special protection schemes, end-to-end testing, distributed application within substation, etc.) and data collection requirements, as well as the test procedure definitions. This guide describes the methods, extent, and types of system tests for protection applications at various voltage levels. Control functions inherent to the protective systems are included. Importance of line testing, indirect trip applications, open/closed-loop tests, and dynamic/nonlinear tests are also covered.