• IPC 9261A:2006

IPC 9261A:2006

In-Process DPMO and Estimated Yield for PCAs

Association Connecting Electronics Industries , 10/01/2006

Publisher: IPC

File Format: PDF

$50.00$101.00


Now updated to align with IPC-7912A for end item DPMO, this document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912A. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates. 12 pages. Released October 2006.

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