• SAE J2052_201607

SAE J2052_201607

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

SAE International , 07/12/2016

Publisher: SAE

File Format: PDF

$37.00$74.00


This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

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