Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
IEC 61280-2-2 Ed. 2.0 b:2005 History
IEC 61280-2-2 Ed. 4.0 b:2012
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IEC 61280-2-2 Ed. 4.0 en:2012
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$77.00 $154.00
IEC 61280-2-2 Ed. 2.0 b:2005
$59.00 $119.00
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