This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition:
- the necessity of DC coupling for extinction ratio measurement is clarified;
- the definition of extinction ratio has been revised to better harmonize with ITU-T; and
- the definition of OMA has been clarified.
- the necessity of DC coupling for extinction ratio measurement is clarified;
- the definition of extinction ratio has been revised to better harmonize with ITU-T; and
- the definition of OMA has been clarified.
IEC 61280-2-2 Ed. 3.0 b:2008 History
IEC 61280-2-2 Ed. 4.0 b:2012
$117.00 $234.00
IEC 61280-2-2 Ed. 4.0 en:2012
$117.00 $234.00
IEC 61280-2-2 Ed. 3.0 b:2008
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IEC 61280-2-2 Ed. 2.0 b:2005
$59.00 $119.00
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